SWTW 2007 - Call for Presentations

CALL FOR PRESENTATIONS

Scope

The SWTW is the only IEEE/CS sponsored event that focuses on all the aspects associated with microelectronic wafer and die level testing. The conference has a mixture of manufacturer and vendor presentations. It is not a sales show, nor an academic or theoretical conference. It is a probe technology forum where attendees come to learn about recent developments in the industry and exchange ideas. There is a relaxed atmosphere with social activities and plenty of time for informal discussion and networking.

Topics for this year will include:

New probe card and contactor technologies
Challenges of 300-mm wafer probing
Monitor and reduction of chip I/O pad damage
Area array and C4 solder bump probing
Parallel, multi-site probing
Probe Card PCB Characterization
Productivity improvements for high volume production
Probe data collection, analysis, and management
Probe Card cleaning, extending card life, improving cost of ownership
Advances in Probe Card Analyzers and metrology tools
Addressing unique probing requirements:
- Copper I/O pads
- RF and microwave
- Mixed signal, low noise, and parametric
- Low-k dielectric and Probe Over Active Circuitry
- Probing for Known Good Die
- High power devices
- Probe Potpourri (anything goes)

Submissions

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Please submit a 250-word abstract (MS-Word format) for a 25-minute presentation (no technical paper) by March 2, 2007, to abstractsubmission@swtest.org. Please include the presentation title and the primary author contact information. The authors of accepted presentations will be notified by March 30, 2007. For 2007, a MS-PowerPoint presentation template will be provided to the authors, and the completed presentations must be received by no later May 21, 2007, for inclusion in the program

Select presentations from SWTW-2007 will be eligible for presentation during a special Technical Session during SEMICON-West 2007!

Contact

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For more information, please contact either:

Dr. Jerry Broz
International Test Solutions
General Chairman
jerry.broz@swtest.org

Brett Crump
Micron Technology, Inc.
Program Chair
bcrump@micron.com

William Mann
Chairman Emeritus
william.mann@ieee.org

For more information, visit us on the web at: http://www.swtest.org

The SW Test Workshop (SWTW 2007) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

CALL FOR PRESENTATIONS
Scope -- Submissions -- Contact
Scope
The SWTW is the only IEEE/CS sponsored event that focuses on all the aspects associated with microelectronic wafer and die level testing. The conference has a mixture of manufacturer and vendor presentations. It is not a sales show, nor an academic or theoretical conference. It is a probe technology forum where attendees come to learn about recent developments in the industry and exchange ideas. There is a relaxed atmosphere with social activities and plenty of time for informal discussion and networking. Topics for this year will include: New probe card and contactor technologies Challenges of 300-mm wafer probing Monitor and reduction of chip I/O pad damage Area array and C4 solder bump probing Parallel, multi-site probing Probe Card PCB Characterization Productivity improvements for high volume production Probe data collection, analysis, and management Probe Card cleaning, extending card life, improving cost of ownership Advances in Probe Card Analyzers and metrology tools Addressing unique probing requirements: Copper I/O pads RF and microwave Mixed signal, low noise, and parametric Low-k dielectric and Probe Over Active Circuitry Probing for Known Good Die High power devices Probe Potpourri (anything goes)
Submissions	top
Please submit a 250-word abstract (MS-Word format) for a 25-minute presentation (no technical paper) by March 2, 2007, to abstractsubmission@swtest.org. Please include the presentation title and the primary author contact information. The authors of accepted presentations will be notified by March 30, 2007. For 2007, a MS-PowerPoint presentation template will be provided to the authors, and the completed presentations must be received by no later May 21, 2007, for inclusion in the program *Select presentations from SWTW-2007 will be eligible for presentation during a special Technical Session during SEMICON-West 2007!*
Contact	top
For more information, please contact either: Dr. Jerry Broz International Test Solutions General Chairman jerry.broz@swtest.org Brett Crump Micron Technology, Inc. Program Chair bcrump@micron.com William Mann Chairman Emeritus william.mann@ieee.org
For more information, visit us on the web at: http://www.swtest.org
The SW Test Workshop (SWTW 2007) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).